Alan Barlow,
Senior Instrumentation & Software Engineer,
National Instruments LabWindows Certified Developer,
TRW Conekt, UK. www.conekt.net

Products Used:
LabWindows/CVI v8.1
ECU and Measurement Toolkit
NI-CAN v2.5
4 Dual Port National Instruments CAN cards (series 2)

The Challenge:
Providing a cost effective, fully featured Automatic Test Equipment (ATE) system that embeds sufficient flexibility to allow the customer to use the rig with successive test unit designs throughout the product development cycle.

The Solution:
By combining Conekt’s proven modular LabWindows/CVI based test kit design with the NI ECU Measurement and Calibration Toolkit, a flexible rig was produced that could easily be upgraded for use with new software releases as they became available during the product development.